A dynamic calibration method for injection-dependent charge carrier lifetime measurements
A dynamic calibration method for injection-dependent charge carrier lifetime measurements
A dynamic calibration method for injection-dependent charge carrier lifetime measurements
Development of novel characterisation methods
Journal - ACDC
Spatially resolved defects parameters of the D1 dislocation center in silicon using temperature- and injection-dependent hyperspectral photoluminescence mapping
Numerical simulations of two-photon absorption time-resolved photoluminescence to extract the bulk lifetime of semiconductors under varying surface recombination velocities